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Anshan Giai Photonics Co.,Ltd
Anshan Giai Photonics Co.,Ltd  

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Custom Optics Interferometry Windows Optical Windows For Inspection 1 Inch Dia Dual Surface 

Payment Terms: T/T 
Place of Origin: Liaoning, China (Mainland) 
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Product Detail

Model No.: GA-IW
Production Capacity: 10,000pcs per month
Delivery Date: 15 working days after recei...
Size: customized
Use: laser enquipment
Means of Transport: Air
Packing: vacuum packaging
Brand Name: GIAI
Material: Fused Silica

Interferometry Windows are used to measure the flatness of optical surfaces or certain optical components to ensure accuracy for quality assurance

Description: 

Interferometry Windows are used to measure the flatness of optical surfaces or certain optical components to ensure accuracy for a wide range of quality assurance or inspection applications. Interferometry Windows are optical surfaces that have been polished to an extremely precise level of flatness which are used as reference plates. Interferometry Windows are laid atop inspected surfaces at a specific angle while a laser beam is directed between them so that interference bands may be measured to determine flatness levels. Dual or single surface Interferometry Windows are both available. Our dual surface optical flats are precision ground and polished to the stated accuracies on both surfaces so that either face may be used for test applications. Both surfaces are tested and certified by our Zygo Interferometer. Each flat ships in a durable storage case for permanent protection. 1/4 λflats also include a certificate of calibration

 

 

Competitive Advantage: 

Interferometry Windows   ,competitive price , good quality, delivery on time, providing perfect after-sales service, to provide customers with professional customized products of parameter. We will supply you with best solution.

 

 

Specifications: 

Construction

Dual Surface

Diameter (inches)

1.00

Diameter (mm)

25.4

Diameter Tolerance (inches)

±0.10

Thickness (inches)

0.50

Thickness (mm)

12.7

Thickness Tolerance (inches)

±0.10

Substrate

Fused Silica

Surface Accuracy (λ)

1/10

Coating

Uncoated

Index of Refraction nd

1.458

Abbe Number (vd)

67.7

Density (g/cm3)

2.2

Coefficient of Thermal Expansion  

0.55

Surface Quality

60 - 40

Parallelism (arcseconds)

30

Wavelength Range (um)

0.2 - 2.2

Type

Interferometry

RoHS

Compliant (View Certificate)

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skype Mr. Jiang Peng

Tel: 86-412-5267636
Fax: 86-412-5267336
Mobile: 86- 181 2638 9974
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Company Info

Anshan Giai Photonics Co.,Ltd [China (Mainland)]


Business Type:Manufacturer
City: Anshan
Province/State: Liaoning
Country/Region: China (Mainland)

Jiang Peng:   skype

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